The unique constellation of MEMUNITY ensures that a custom test routine for your devices can be devised, first batches tested for you and when your volume is high enough, the equipment you need can be provided in-house.

Previously, sensors could only be tested with the stimuli they require at the end of the production process. The non-electrical output of actuators could also only be measured when already packaged. Testing before the packaging process was limited to using an electrical current to ascertain certain parameters but functional test was impossible.

Working with leading MEMS companies, SUSS, DELTA and POLYTEC have developed revolutionary new test techniques and products which enable the direct application of non-electrical input and/or output such as light, pressure, motion, acceleration, temperature and sound to each individual die at wafer level or at any stage before the device is packaged.

This means that device and technology development, process control and functional test can be undertaken at early stages saving time and money.

The following is just a sample of the microsystems that can be tested:

• Pressure Sensors
• Microphones
• Accelerometers
• MEMS Modules
• Testing in a vacuum
• Motion Analysis
• RF MEMS

Tell MEMUNITY what type of sensors you would like to test at wafer level and we will find the turnkey solution to meet your needs. WRITE US AN EMAIL